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Alfons Juan-Ciscar; Gemma Sanchez PRIS 2008. Pattern Recognition in Information Systems. Proceedings of the 8th international Workshop on Pattern Recognition in Information systems – PRIS 2008, in conjunction with ICEIS 2008 2008 details   openurl
Albert Suso; Pau Riba; Oriol Ramos Terrades; Josep Llados A Self-supervised Inverse Graphics Approach for Sketch Parametrization 2021 16th International Conference on Document Analysis and Recognition 12916 28-42 details   url
Albert Gordo; Marçal Rusiñol; Dimosthenis Karatzas; Andrew Bagdanov Document Classification and Page Stream Segmentation for Digital Mailroom Applications 2013 12th International Conference on Document Analysis and Recognition 621-625 details   pdf doi
Albert Gordo; Jose Antonio Rodriguez; Florent Perronnin; Ernest Valveny Leveraging category-level labels for instance-level image retrieval 2012 25th IEEE Conference on Computer Vision and Pattern Recognition 3045-3052 details   pdf doi
Albert Gordo; Jaume Gibert; Ernest Valveny; Marçal Rusiñol A Kernel-based Approach to Document Retrieval 2010 9th IAPR International Workshop on Document Analysis Systems 377–384 details   doi
Albert Gordo; Florent Perronnin; Yunchao Gong; Svetlana Lazebnik Asymmetric Distances for Binary Embeddings 2014 IEEE Transactions on Pattern Analysis and Machine Intelligence 36 33-47 details   pdf doi
Albert Gordo; Florent Perronnin; Ernest Valveny Large-scale document image retrieval and classification with runlength histograms and binary embeddings 2013 Pattern Recognition 46 1898-1905 details   pdf doi
Albert Gordo; Florent Perronnin; Ernest Valveny Document classification using multiple views 2012 10th IAPR International Workshop on Document Analysis Systems 33-37 details   pdf doi
Albert Gordo; Florent Perronnin A Bag-of-Pages Approach to Unordered Multi-Page Document Classification 2010 20th International Conference on Pattern Recognition 1920–1923 details   doi
Albert Gordo; Florent Perronnin Asymmetric Distances for Binary Embeddings 2011 IEEE Conference on Computer Vision and Pattern Recognition 729 - 736 details   doi
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