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Author (up) Eduard Vazquez; Ramon Baldrich; Joost Van de Weijer; Maria Vanrell edit   pdf
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openurl 
  Title Describing Reflectances for Colour Segmentation Robust to Shadows, Highlights and Textures Type Journal Article
  Year 2011 Publication IEEE Transactions on Pattern Analysis and Machine Intelligence Abbreviated Journal TPAMI  
  Volume 33 Issue 5 Pages 917-930  
  Keywords  
  Abstract The segmentation of a single material reflectance is a challenging problem due to the considerable variation in image measurements caused by the geometry of the object, shadows, and specularities. The combination of these effects has been modeled by the dichromatic reflection model. However, the application of the model to real-world images is limited due to unknown acquisition parameters and compression artifacts. In this paper, we present a robust model for the shape of a single material reflectance in histogram space. The method is based on a multilocal creaseness analysis of the histogram which results in a set of ridges representing the material reflectances. The segmentation method derived from these ridges is robust to both shadow, shading and specularities, and texture in real-world images. We further complete the method by incorporating prior knowledge from image statistics, and incorporate spatial coherence by using multiscale color contrast information. Results obtained show that our method clearly outperforms state-of-the-art segmentation methods on a widely used segmentation benchmark, having as a main characteristic its excellent performance in the presence of shadows and highlights at low computational cost.  
  Address Los Alamitos; CA; USA;  
  Corporate Author Thesis  
  Publisher IEEE Computer Society Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 0162-8828 ISBN Medium  
  Area Expedition Conference  
  Notes CIC Approved no  
  Call Number Admin @ si @ VBW2011 Serial 1715  
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