toggle visibility Search & Display Options

Select All    Deselect All
 |   | 
Details
   print
  Record Links
Author (up) Mathieu Nicolas Delalandre; Jean-Yves Ramel; Ernest Valveny; Muhammad Muzzamil Luqman edit  openurl
  Title A Performance Characterization Algorithm for Symbol Localization Type Conference Article
  Year 2009 Publication 8th IAPR International Workshop on Graphics Recognition Abbreviated Journal  
  Volume Issue Pages 3-11  
  Keywords  
  Abstract In this paper we present an algorithm for performance characterization of symbol localization systems. This algorithm is aimed to be a more “reliable” and “open” solution to characterize the performance. To achieve that, it exploits only single points as the result of localization and offers the possibility to reconsider the localization results provided by a system. We use the information about context in groundtruth, and overall localization results, to detect the ambiguous localization results. A probability score is computed for each matching between a localization point and a groundtruth region, depending on the spatial distribution of the other regions in the groundtruth. Final characterization is given with detection rate/probability score plots, describing the sets of possible interpretations of the localization results, according to a given confidence rate. We present experimentation details along with the results for the symbol localization system of [1], exploiting a synthetic dataset of architectural floorplans and electrical diagrams (composed of 200 images and 3861 symbols).  
  Address La Rochelle; July 2009  
  Corporate Author Thesis  
  Publisher Springer Place of Publication Editor  
  Language Summary Language Original Title  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN ISBN Medium  
  Area Expedition Conference GREC  
  Notes DAG Approved no  
  Call Number DAG @ dag @ DRV2009 Serial 1443  
Permanent link to this record
Select All    Deselect All
 |   | 
Details
   print

Save Citations:
Export Records: