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Author Josep M. Gonfaus; Theo Gevers; Arjan Gijsenij; Xavier Roca; Jordi Gonzalez edit   pdf
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  Title Edge Classification using Photo-Geo metric features Type Conference Article
  Year 2012 Publication 21st International Conference on Pattern Recognition Abbreviated Journal  
  Volume Issue Pages 1497 - 1500  
  Keywords  
  Abstract Edges are caused by several imaging cues such as shadow, material and illumination transitions. Classification methods have been proposed which are solely based on photometric information, ignoring geometry to classify the physical nature of edges in images. In this paper, the aim is to present a novel strategy to handle both photometric and geometric information for edge classification. Photometric information is obtained through the use of quasi-invariants while geometric information is derived from the orientation and contrast of edges. Different combination frameworks are compared with a new principled approach that captures both information into the same descriptor. From large scale experiments on different datasets, it is shown that, in addition to photometric information, the geometry of edges is an important visual cue to distinguish between different edge types. It is concluded that by combining both cues the performance improves by more than 7% for shadows and highlights.  
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  Language Summary Language Original Title (up)  
  Series Editor Series Title Abbreviated Series Title  
  Series Volume Series Issue Edition  
  ISSN 1051-4651 ISBN 978-1-4673-2216-4 Medium  
  Area Expedition Conference ICPR  
  Notes ISE Approved no  
  Call Number Admin @ si @ GGG2012b Serial 2142  
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