TY - CONF AU - F.X. Perez AU - F. Javier Sanchez AU - Xavier Binefa AU - Xavier Roca AU - Jordi Vitria AU - Juan J. Villanueva PY - 1993// TI - A mathematical morphology-based system for IC´s inspection and analysis. BT - Institute of Physics Conferences Series SP - 381–384 VL - 135 IS - 10 PB - Institute of Physics UR - http://www.iop.org N1 - MV;OR;ISE ID - F.X. Perez1993 ER -