%0 Conference Proceedings
%T A mathematical morphology-based system for IC´s inspection and analysis.
%A F.X. Perez
%A F. Javier Sanchez
%A Xavier Binefa
%A Xavier Roca
%A Jordi Vitria
%A Juan J. Villanueva
%B Institute of Physics Conferences Series
%D 1993
%V 135
%N 10
%I Institute of Physics
%F F.X. Perez1993
%O MV;OR;ISE
%O exported from refbase (http://refbase.cvc.uab.es/show.php?record=150), last updated on Wed, 28 Jul 2021 10:07:27 +0200
%U http://www.iop.org
%P 381–384