F.X. Perez, F. Javier Sanchez, Xavier Binefa, Xavier Roca, Jordi Vitria, & Juan J. Villanueva. (1993).<a target='_blank' href='http://www.iop.org' >  A mathematical morphology-based system for IC´s inspection and analysis. </a> In Institute of Physics Conferences Series (Vol. 135, pp. 381–384). Institute of Physics.