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| Author | Title | Year | Publication | Volume | Pages |
|---|---|---|---|---|---|
| F.X. Perez; F. Javier Sanchez; Xavier Binefa; Xavier Roca; Jordi Vitria; Juan J. Villanueva | A mathematical morphology-based system for IC´s inspection and analysis. | 1993 | Institute of Physics Conferences Series | 135 | 381–384 |