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Title
Year
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Volume
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Cristhian A. Aguilera-Carrasco; F. Aguilera; Angel Sappa; C. Aguilera; Ricardo Toledo
Learning cross-spectral similarity measures with deep convolutional neural networks
2016
29th IEEE Conference on Computer Vision and Pattern Recognition Worshops
Vassileios Balntas; Edgar Riba; Daniel Ponsa; Krystian Mikolajczyk
Learning local feature descriptors with triplets and shallow convolutional neural networks
2016
27th British Machine Vision Conference
Lorenzo Porzi; Markus Hofinger; Idoia Ruiz; Joan Serrat; Samuel Rota Bulo; Peter Kontschieder
Learning Multi-Object Tracking and Segmentation from Automatic Annotations
2020
33rd IEEE Conference on Computer Vision and Pattern Recognition
6845-6854
Jose Manuel Alvarez; Theo Gevers; Antonio Lopez
Learning Photometric Invariance from Diversified Color Model Ensembles
2009
22nd IEEE Conference on Computer Vision and Pattern Recognition
565–572
Patricia Suarez; Angel Sappa; Boris X. Vintimilla
Learning to Colorize Infrared Images
2017
15th International Conference on Practical Applications of Agents and Multi-Agent System
Chris Bahnsen; David Vazquez; Antonio Lopez; Thomas B. Moeslund
Learning to Remove Rain in Traffic Surveillance by Using Synthetic Data
2019
14th International Conference on Computer Vision Theory and Applications
123-130
Saad Minhas; Aura Hernandez-Sabate; Shoaib Ehsan; Katerine Diaz; Ales Leonardis; Antonio Lopez; Klaus McDonald Maier
LEE: A photorealistic Virtual Environment for Assessing Driver-Vehicle Interactions in Self-Driving Mode
2016
14th European Conference on Computer Vision Workshops
9915
894-900
Cristhian A. Aguilera-Carrasco; Angel Sappa; Ricardo Toledo
LGHD: a Feature Descriptor for Matching Across Non-Linear Intensity Variations
2015
22th IEEE International Conference on Image Processing
178 - 181
Patricia Marquez; Debora Gil; R.Mester; Aura Hernandez-Sabate
Local Analysis of Confidence Measures for Optical Flow Quality Evaluation
2014
9th International Conference on Computer Vision Theory and Applications
3
450-457
Marc Masana; Idoia Ruiz; Joan Serrat; Joost Van de Weijer; Antonio Lopez
Metric Learning for Novelty and Anomaly Detection
2018
29th British Machine Vision Conference
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