Abstract: Plaque analysis in IVUS planes needs accurate intima and adventitia models. Large variety in adventitia descriptors difficulties its detection and motivates using a classification strategy for selecting points on the structure. Whatever the set of descriptors used, the selection stage suffers from fake responses due to noise and uncompleted true curves. In order to smooth background noise while strengthening responses, we apply a restricted anisotropic filter that homogenizes grey levels along the image significant structures. Candidate points are extracted by means of a simple semi supervised adaptive classification of the filtered image response to edge and calcium detectors. The final model is obtained by interpolating the former line segments with an anisotropic contour closing technique based on functional extension principles.
Keywords: Electron microscopy; Unbending; 2D crystal; Interpolation; Approximation