CVC Home

Publicacions CVC

Home |  Show All |  Simple Search |  Advanced Search  | Add Record  | Import
Quick Search:
1–1 of 1 record found matching your query (RSS):
toggle visibility Search & Display Options
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
X. Binefa, F. Javier Sanchez, F.X. Perez, Xavier Roca, Jordi Vitria, & Juan J. Villanueva. (1993). Using defocus in optical inspection of integrated circuits. In Institute of Physics Conferences Series (Vol. 135, pp. 389–392). Institute of Physics.
toggle visibility
details   openurl
Select All    Deselect All << 1 >>
List View
 | 
Citations
 | 
Details
   print
toggle visibility Cite, Group & Export Options
Home SQL Search  |  Library Search  |  Show Record  |  Extract Citations Help