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Ciprian Corneanu; Sergio Escalera; Aleix M. Martinez Computing the Testing Error Without a Testing Set 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition details   pdf openurl
Lorenzo Porzi; Markus Hofinger; Idoia Ruiz; Joan Serrat; Samuel Rota Bulo; Peter Kontschieder Learning Multi-Object Tracking and Segmentation from Automatic Annotations 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition 6845-6854 details   pdf doi
Lu Yu; Bartlomiej Twardowski; Xialei Liu; Luis Herranz; Kai Wang; Yongmai Cheng; Shangling Jui; Joost Van de Weijer Semantic Drift Compensation for Class-Incremental Learning of Embeddings 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition details   pdf openurl
Swathikiran Sudhakaran; Sergio Escalera; Oswald Lanz Gate-Shift Networks for Video Action Recognition 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition details   pdf openurl
Vacit Oguz Yazici; Abel Gonzalez-Garcia; Arnau Ramisa; Bartlomiej Twardowski; Joost Van de Weijer Orderless Recurrent Models for Multi-label Classification 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition details   pdf url
Yaxing Wang; Abel Gonzalez-Garcia; David Berga; Luis Herranz; Fahad Shahbaz Khan; Joost Van de Weijer MineGAN: effective knowledge transfer from GANs to target domains with few images 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition details   pdf openurl
Yaxing Wang; Salman Khan; Abel Gonzalez-Garcia; Joost Van de Weijer; Fahad Shahbaz Khan Semi-supervised Learning for Few-shot Image-to-Image Translation 2020 33rd IEEE Conference on Computer Vision and Pattern Recognition details   pdf openurl
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