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Author Title Year (down) Publication Volume Pages
Adriana Romero; Petia Radeva; Carlo Gatta Meta-parameter free unsupervised sparse feature learning 2015 IEEE Transactions on Pattern Analysis and Machine Intelligence 37 1716-1722
Albert Gordo; Florent Perronnin; Yunchao Gong; Svetlana Lazebnik Asymmetric Distances for Binary Embeddings 2014 IEEE Transactions on Pattern Analysis and Machine Intelligence 36 33-47
Jiaolong Xu; Sebastian Ramos; David Vazquez; Antonio Lopez Domain Adaptation of Deformable Part-Based Models 2014 IEEE Transactions on Pattern Analysis and Machine Intelligence 36 2367-2380
David Vazquez; Javier Marin; Antonio Lopez; Daniel Ponsa; David Geronimo Virtual and Real World Adaptation for Pedestrian Detection 2014 IEEE Transactions on Pattern Analysis and Machine Intelligence 36 797-809
Carlo Gatta; Francesco Ciompi Stacked Sequential Scale-Space Taylor Context 2014 IEEE Transactions on Pattern Analysis and Machine Intelligence 36 1694-1700
Lorenzo Seidenari; Giuseppe Serra; Andrew Bagdanov; Alberto del Bimbo Local pyramidal descriptors for image recognition 2014 IEEE Transactions on Pattern Analysis and Machine Intelligence 36 1033 - 1040
Arjan Gijsenij; Theo Gevers Color Constancy Using Natural Image Statistics and Scene Semantics 2011 IEEE Transactions on Pattern Analysis and Machine Intelligence 33 687-698
Oriol Ramos Terrades; Ernest Valveny; Salvatore Tabbone Optimal Classifier Fusion in a Non-Bayesian Probabilistic Framework 2009 IEEE Transactions on Pattern Analysis and Machine Intelligence 31 1630–1644
Oriol Pujol; David Masip Geometry-Based Ensembles: Toward a Structural Characterization of the Classification Boundary 2009 IEEE Transactions on Pattern Analysis and Machine Intelligence 31 1140–1146
E. Provenzi; Carlo Gatta; M. Fierro; A. Rizzi A Spatially Variant White-Patch and Gray-World Method for Color Image Enhancement Driven by Local Constant 2008 IEEE Transactions on Pattern Analysis and Machine Intelligence 30 1757–1770
Josep Llados; Enric Marti; Juan J.Villanueva Symbol recognition by error-tolerant subgraph matching between region adjacency graphs 2001 IEEE Transactions on Pattern Analysis and Machine Intelligence 23 1137-1143