| Home | << 1 >> |
|
| Author | Title | Year  |
Publication | Volume | Pages |
|---|---|---|---|---|---|
| Josep M. Gonfaus; Theo Gevers; Arjan Gijsenij; Xavier Roca; Jordi Gonzalez | Edge Classification using Photo-Geo metric features | 2012 | 21st International Conference on Pattern Recognition | 1497 - 1500 |