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Author | Title | Year | Publication | Volume | Pages |
---|---|---|---|---|---|
J. Garcia; J.M. Sanchez; X. Orriols; X. Binefa | Chromatic aberration and depth extraction. | 2000 | 15 th International Conference on Pattern Recognition | 1 | 762-765 |
A. Pujol; Juan J. Villanueva; H. Wechsler | Automatic View Based Caricaturing. | 2000 | 15 th International Conference on Pattern Recognition | 1 | 1072-1075 |