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Author | Bojana Gajic; Ariel Amato; Ramon Baldrich; Joost Van de Weijer; Carlo Gatta |
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Title | Area Under the ROC Curve Maximization for Metric Learning | Type | Conference Article | |||
Year | 2022 | Publication | CVPR 2022 Workshop on Efficien Deep Learning for Computer Vision (ECV 2022, 5th Edition) | Abbreviated Journal | ||
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Keywords | Training; Computer vision; Conferences; Area measurement; Benchmark testing; Pattern recognition | |||||
Abstract | Most popular metric learning losses have no direct relation with the evaluation metrics that are subsequently applied to evaluate their performance. We hypothesize that training a metric learning model by maximizing the area under the ROC curve (which is a typical performance measure of recognition systems) can induce an implicit ranking suitable for retrieval problems. This hypothesis is supported by previous work that proved that a curve dominates in ROC space if and only if it dominates in Precision-Recall space. To test this hypothesis, we design and maximize an approximated, derivable relaxation of the area under the ROC curve. The proposed AUC loss achieves state-of-the-art results on two large scale retrieval benchmark datasets (Stanford Online Products and DeepFashion In-Shop). Moreover, the AUC loss achieves comparable performance to more complex, domain specific, state-of-the-art methods for vehicle re-identification. | |||||
Address | New Orleans, USA; 20 June 2022 | |||||
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Area | Expedition | Conference | CVPRW | |||
Notes | CIC; LAMP; | Approved | no | |||
Call Number | Admin @ si @ GAB2022 | Serial | 3700 | |||
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