Home | << 1 >> |
![]() |
Author | Title | Year | Publication | Volume | Pages ![]() |
---|---|---|---|---|---|
F.X. Perez; F. Javier Sanchez; Xavier Binefa; Xavier Roca; Jordi Vitria; Juan J. Villanueva | A mathematical morphology-based system for IC´s inspection and analysis. | 1993 | Institute of Physics Conferences Series | 135 | 381–384 |