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Author Title Year Publication Volume Pages
Sergio Escalera; Mercedes Torres-Torres; Brais Martinez; Xavier Baro; Hugo Jair Escalante; Isabelle Guyon; Georgios Tzimiropoulos; Ciprian Corneanu; Marc Oliu Simón; Mohammad Ali Bagheri; Michel Valstar ChaLearn Looking at People and Faces of the World: Face AnalysisWorkshop and Challenge 2016 2016 29th IEEE Conference on Computer Vision and Pattern Recognition Workshops
Simon Jégou; Michal Drozdzal; David Vazquez; Adriana Romero; Yoshua Bengio The One Hundred Layers Tiramisu: Fully Convolutional DenseNets for Semantic Segmentation 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops
Patricia Suarez; Angel Sappa; Boris X. Vintimilla Infrared Image Colorization based on a Triplet DCGAN Architecture 2017 IEEE Conference on Computer Vision and Pattern Recognition Workshops
Arka Ujjal Dey; Suman Ghosh; Ernest Valveny Don't only Feel Read: Using Scene text to understand advertisements 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops
Albert Clapes; Ozan Bilici; Dariia Temirova; Egils Avots; Gholamreza Anbarjafari; Sergio Escalera From apparent to real age: gender, age, ethnic, makeup, and expression bias analysis in real age estimation 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops 2373-2382
Dena Bazazian; Dimosthenis Karatzas; Andrew Bagdanov Word Spotting in Scene Images based on Character Recognition 2018 IEEE/CVF Conference on Computer Vision and Pattern Recognition Workshops 1872-1874
Patricia Suarez; Angel Sappa; Boris X. Vintimilla; Riad I. Hammoud Deep Learning based Single Image Dehazing 2018 31st IEEE Conference on Computer Vision and Pattern Recognition Workhsop 1250 - 12507
Armin Mehri; Angel Sappa Colorizing Near Infrared Images through a Cyclic Adversarial Approach of Unpaired Samples 2019 IEEE International Conference on Computer Vision and Pattern Recognition-Workshops
Patricia Suarez; Angel Sappa; Boris X. Vintimilla; Riad I. Hammoud Image Vegetation Index through a Cycle Generative Adversarial Network 2019 IEEE International Conference on Computer Vision and Pattern Recognition-Workshops
Ajian Liu; Jun Wan; Sergio Escalera; Hugo Jair Escalante; Zichang Tan; Qi Yuan; Kai Wang; Chi Lin; Guodong Guo; Isabelle Guyon; Stan Z. Li Multi-Modal Face Anti-Spoofing Attack Detection Challenge at CVPR2019 2019 IEEE International Conference on Computer Vision and Pattern Recognition-Workshop
Xialei Liu; Chenshen Wu; Mikel Menta; Luis Herranz; Bogdan Raducanu; Andrew Bagdanov; Shangling Jui; Joost Van de Weijer Generative Feature Replay for Class-Incremental Learning 2020 CLVISION – Workshop on Continual Learning in Computer Vision
Henry Velesaca; Raul Mira; Patricia Suarez; Christian X. Larrea; Angel Sappa Deep Learning Based Corn Kernel Classification 2020 1st International Workshop and Prize Challenge on Agriculture-Vision: Challenges & Opportunities for Computer Vision in Agriculture
Rafael E. Rivadeneira; Angel Sappa; Boris X. Vintimilla; Lin Guo; Jiankun Hou; Armin Mehri; Parichehr Behjati Ardakani; Heena Patel; Vishal Chudasama; Kalpesh Prajapati; Kishor P. Upla; Raghavendra Ramachandra; Kiran Raja; Christoph Busch; Feras Almasri; Olivier Debeir; Sabari Nathan; Priya Kansal; Nolan Gutierrez; Bardia Mojra; William J. Beksi Thermal Image Super-Resolution Challenge – PBVS 2020 2020 16h IEEE Workshop on Perception Beyond the Visible Spectrum
Kai Wang; Luis Herranz; Joost Van de Weijer Continual learning in cross-modal retrieval 2021 2nd CLVISION workshop 3628-3638
Vincenzo Lomonaco; Lorenzo Pellegrini; Andrea Cossu; Antonio Carta; Gabriele Graffieti; Tyler L. Hayes; Matthias De Lange; Marc Masana; Jary Pomponi; Gido van de Ven; Martin Mundt; Qi She; Keiland Cooper; Jeremy Forest; Eden Belouadah; Simone Calderara; German I. Parisi; Fabio Cuzzolin; Andreas Tolias; Simone Scardapane; Luca Antiga; Subutai Amhad; Adrian Popescu; Christopher Kanan; Joost Van de Weijer; Tinne Tuytelaars; Davide Bacciu; Davide Maltoni Avalanche: an End-to-End Library for Continual Learning 2021 34th IEEE Conference on Computer Vision and Pattern Recognition Workshops 3595-3605