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Author  |
X. Orriols; Ricardo Toledo; X. Binefa; Petia Radeva; Jordi Vitria; Juan J. Villanueva | ||||
| Title | Probabilistic Saliency Approach for Elongated Structure Detection using Deformable Models. | Type | Miscellaneous | ||
| Year | 2000 | Publication | 15 th International Conference on Pattern Recognition, 3:1018–1021. | Abbreviated Journal | |
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| Address | Barcelona. | ||||
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| Area | Expedition | Conference | |||
| Notes | OR;MILAB;ADAS;MV | Approved | no | ||
| Call Number | BCNPCL @ bcnpcl @ OTB2000 | Serial | 224 | ||
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