|   | 
Details
   web
Record
Author Josep M. Gonfaus; Theo Gevers; Arjan Gijsenij; Xavier Roca; Jordi Gonzalez
Title Edge Classification using Photo-Geo metric features Type Conference Article
Year 2012 Publication 21st International Conference on Pattern Recognition Abbreviated Journal
Volume Issue Pages 1497 - 1500
Keywords
Abstract Edges are caused by several imaging cues such as shadow, material and illumination transitions. Classification methods have been proposed which are solely based on photometric information, ignoring geometry to classify the physical nature of edges in images. In this paper, the aim is to present a novel strategy to handle both photometric and geometric information for edge classification. Photometric information is obtained through the use of quasi-invariants while geometric information is derived from the orientation and contrast of edges. Different combination frameworks are compared with a new principled approach that captures both information into the same descriptor. From large scale experiments on different datasets, it is shown that, in addition to photometric information, the geometry of edges is an important visual cue to distinguish between different edge types. It is concluded that by combining both cues the performance improves by more than 7% for shadows and highlights.
Address
Corporate Author Thesis
Publisher Place of Publication Editor
Language Summary Language Original Title
Series Editor Series Title Abbreviated Series Title
Series Volume Series Issue Edition
ISSN 1051-4651 ISBN 978-1-4673-2216-4 Medium
Area Expedition Conference ICPR
Notes ISE Approved (up) no
Call Number Admin @ si @ GGG2012b Serial 2142
Permanent link to this record