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B. Moghaddam, David Guillamet, & Jordi Vitria. (2003). Local Appearance-Based Models using High-Order Statistics of Image Features.
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Xose M. Pardo, Petia Radeva, & D. Cabello. (2003). Discriminant Snakes for 3D Reconstruction of Anatomical Organs. Medical Image Analysis, 7(3): 293–310 (IF: 4.442).
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Daniel Ponsa, Robert Benavente, Felipe Lumbreras, Judit Martinez, & Xavier Roca. (2003). Quality control of safety belts by machine vision inspection for real-time production. Optical Engineering (IF: 0.877), 42(4), 1114–1120.
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Petia Radeva. (2003). On the Role of Intravascular Ultrasound Image Analysis.
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Petia Radeva, & Jordi Vitria. (2003). “Inteligencia artificial” Centre de Visio per Computador.
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Oriol Ramos Terrades, & Ernest Valveny. (2003). Indexing Technical Symbols Using Ridgelets Transform.
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Oriol Ramos Terrades, & Ernest Valveny. (2003). Radon Transform for Lineal Symbol Representation.
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J. Suri, S. Singh, S. Laxminarayan, R. Cesar, H. Jelinek, Petia Radeva, et al. (2003). A Note on Future Research in Vascular and Plaque Segmentation.
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Ernest Valveny, & Antonio Lopez. (2003). Numeral Recognition for Quality Control of Surgical Sachets.
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I. King, & Zhong Jin. (2003). Integrated Probability Function and Its Application to Content-Based Image Retrieval By Relevance Feedback. Pattern Recognition, 36(9): 2177–2186 (IF: 1.611).
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X. Jing, David Zhang, & Zhong Jin. (2003). Improvements on the uncorrelated optimal discriminant vectors. Pattern Recognition, 36(8): 1921–1923 (IF: 1.611).
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X. Jing, David Zhang, & Zhong Jin. (2003). Improved algorithm and generalized theory. Pattern Recognition, 36(11): 2593–2602 (IF: 1.611).
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Yong Xu, Jing-Yu Yang, & Zhong Jin. (2003). Theory analysis on FSLDA and ULDA. Pattern Recognition, 36(12): 3031–3033 (IF: 1.611).
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Oriol Pujol, & Petia Radeva. (2003). Texture Segmentation by Statistic Deformable Models. International Journal of Image and Graphics (IJIG).
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J.L. Pech-Pacheco, J. Alvarez-Borrego, Gabriel Cristobal, & Matthias S. Keil. (2003). Automatic object identification irrespective to geometric changes. Optical Engineering, 42(2): 551–559 (IF: 0.877).
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