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Author | X. Orriols; Ricardo Toledo; X. Binefa; Petia Radeva; Jordi Vitria; Juan J. Villanueva | ||||
Title | Probabilistic Saliency Approach for Elongated Structure Detection using Deformable Models. | Type | Conference Article | ||
Year | 2000 | Publication | 15 th International Conference on Pattern Recognition | Abbreviated Journal | |
Volume | 3 | Issue | Pages | 1006-1009 | |
Keywords | |||||
Abstract | |||||
Address | Barcelona. | ||||
Corporate Author | Thesis | ||||
Publisher | Place of Publication | Editor | |||
Language | Summary Language | Original Title | |||
Series Editor | Series Title | Abbreviated Series Title | |||
Series Volume | Series Issue | Edition | |||
ISSN | ISBN | Medium | |||
Area | Expedition | Conference | ICPR | ||
Notes | OR;MILAB;ADAS;MV | Approved | no | ||
Call Number | BCNPCL @ bcnpcl @ OTB2000 | Serial | 224 | ||
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